Introduction Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) are fundamental components in modern electronics, widely used in power management, amplification, and switching applications. However, one of the critical challenges in MOSFET design and operation is managing stress from the source to the drain. This stress can significantly impact the device's performance, reliability, and lifespan. In this blog, we will explore the causes of source-to-drain stress, its effects on MOSFET operation, and effective strategies to mitigate it. What is Source-to-Drain Stress in MOSFETs? Source-to-drain stress refers to the mechanical and electrical forces that occur between the source and drain regions of a MOSFET during operation. These stresses arise due to factors such as high electric fields, thermal gradients, and material mismatches. Understanding these stresses is crucial for designing robust MOSFETs that can withstand demanding operating conditions. Causes of Source-to-D...
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